| Total test solutions are provided from test
program development, test tool design, to production support.
These services cover chip probe and final test program development,
socket, probe card and load board design. With company’s IP
portfolio endeavors on high speed interface and RF product,
our test service capability are being expanded to PCIe, XAUI,
Serdes, SATA, DDRn, LVDS, TMDS those high speed interface products,
as well as RF products such as PA,LNA,mixer/VCO, transmitter/receiver,
and transceiver.
Two in-house ATEs ( Verigy 93K Pin Scale & Teradyne J750)
are available since June 2006. It can reduce test bring up
time significantly. |
